Optimized entropic uncertainty for successive projective measurements

10 March 2014

http://dx.doi.org/10.1103/PhysRevA.89.032108 Kyunghyun Baek, Tristan Farrow, and Wonmin Son Phys. Rev. A 89, 032108 – Published 10 March 2014

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The authors focus on the uncertainty of an observable Y caused by a precise measurement of X. They illustrate the effect by analyzing the general scenario of two successive measurements of spin components X and Y, and derive an optimized entropic uncertainty limit that quantifies the necessary amount of uncertainty observed in a subsequent measurement of Y. They compare this bound to recently derived error-disturbance relations and discuss how the bound quantifies the information of successive quantum measurements.